About this paper

Appears in:
Pages: 5023-5028
Publication year: 2011
ISBN: 978-84-614-7423-3
ISSN: 2340-1079

Conference name: 5th International Technology, Education and Development Conference
Dates: 7-9 March, 2011
Location: Valencia, Spain


M. Shokri, A. Korani

Islamic Azad University, Kermanshah Branch (IRAN)
In this study it is attempted to provide an overview of the concept of self-assessment. As an introduction, it is mentioned that language testing is undergoing a paradigm shift, from psychometric testing to a broader model of assessment called alternative assessment. It is discussed that this shift of paradigm is, perhaps, resulting from pursuing the theoretical foundations of language teaching and SLA research. Then, concerning the concept of alternative assessment techniques it is mentioned that self-assessment is designed to be an on-going part of curriculum while focusing on the learners’ learning as well. It is explained that in self-assessment students assess or judge their own language abilities, language production, or other aspects of their progress. Next, different advantages as well as disadvantages of self-assessment as an alternative assessment technique are presented. As the conclusion, it is argued that according to the research findings students are capable enough to assess themselves accurately and that their ratings have proved to be accurate judgments of their underlying ability.
author = {Shokri, M. and Korani, A.},
series = {5th International Technology, Education and Development Conference},
booktitle = {INTED2011 Proceedings},
isbn = {978-84-614-7423-3},
issn = {2340-1079},
publisher = {IATED},
location = {Valencia, Spain},
month = {7-9 March, 2011},
year = {2011},
pages = {5023-5028}}
AU - M. Shokri AU - A. Korani
SN - 978-84-614-7423-3/2340-1079
PY - 2011
Y1 - 7-9 March, 2011
CI - Valencia, Spain
JO - 5th International Technology, Education and Development Conference
JA - INTED2011 Proceedings
SP - 5023
EP - 5028
ER -
M. Shokri, A. Korani (2011) SELF-ASSESSMENT: AN OVERVIEW, INTED2011 Proceedings, pp. 5023-5028.