Abstract:

Conceptual model and system architecture for self-directed learning was presented in our previous publications. One of most important architectural element is experimental system. This system includes remote labs and simulation environments. We are focused our efforts towards building simulation environment for VLSI circuit diagnosis. The main tools in this environment are: (1) Automatic Test Pattern Generation (ATPG) tool; (2) Diagnostic ATPG (DATPG) tool; (3) Circuit diagnostic tool. These tools have some common modules such as fault simulation and vector generation and as well as some specific modules such as test pattern compactor, diagnosis tree generator and so on. In this paper are presented three fault simulators: concurrent fault simulator for single stuck-at faults; deductive X-fault simulator and event-driven deductive X-fault simulator. X-fault simulators are based on X-fault model, which is used for modeling the multiple faults and Byzantine defects. The two X-fault simulators have been developed in our ambition to optimize performance and reduce simulation time. Here are presented two more tools: X-fault diagnosis tool and measurement simulator. Measurement simulator is developed for verification the diagnostic tools. In the paper are discussed the algorithms and functionality incorporated into the tools as well as obtained results.

Keywords:

VLSI, digital circuit, simulation, tool, diagnosis, web-based environment.