About this paper

Appears in:
Pages: 2837-2844
Publication year: 2010
ISBN: 978-84-613-5538-9
ISSN: 2340-1079

Conference name: 4th International Technology, Education and Development Conference
Dates: 8-10 March, 2010
Location: Valencia, Spain

APPLICATION OF ADVANCED STATISTICAL METHODS TO FIND THE AVERAGE CLASS MARKS: PART II

CM. Chan1, A. Loh2, R. Wong2

1The Hong Kong Polytechnic University (HONG KONG)
2Hong Kong Community College. The Hong Kong Polytechnic University. (HONG KONG)
In Kwan et. al. (2008), the authors have proposed statistical methods to calculate the average class mark of a post-secondary subject - Quantitative Methods. In this paper, it reveals that there was a difference in the results between Quantitative Methods (QM) and Introduction to Information Technology (IIT). This difference could be explained by different student groups with different background of knowledge and experience. We know that there is a sensitivity effect: even a very small proportion of students get fail or extremely outstanding in the subject the average class mark will be influenced to a lower or higher value. By comparing the results in QM and IIT, it proves that using our proposed advanced statistical methods to find the average class marks, the sensitivity effect of extreme marks could be reasonably reduced.

References:

Wilson C.K. Kwan, Chan C. M. and Anthony W.K. Loh (2008) Application of Advanced Statistical Methods To Find The Average Class Marks
Conference proceeding of International Association for Technology, Education and Development, virtual session.
@InProceedings{CHAN2010APP,
author = {Chan, CM. and Loh, A. and Wong, R.},
title = {APPLICATION OF ADVANCED STATISTICAL METHODS TO FIND THE AVERAGE CLASS MARKS: PART II},
series = {4th International Technology, Education and Development Conference},
booktitle = {INTED2010 Proceedings},
isbn = {978-84-613-5538-9},
issn = {2340-1079},
publisher = {IATED},
location = {Valencia, Spain},
month = {8-10 March, 2010},
year = {2010},
pages = {2837-2844}}
TY - CONF
AU - CM. Chan AU - A. Loh AU - R. Wong
TI - APPLICATION OF ADVANCED STATISTICAL METHODS TO FIND THE AVERAGE CLASS MARKS: PART II
SN - 978-84-613-5538-9/2340-1079
PY - 2010
Y1 - 8-10 March, 2010
CI - Valencia, Spain
JO - 4th International Technology, Education and Development Conference
JA - INTED2010 Proceedings
SP - 2837
EP - 2844
ER -
CM. Chan, A. Loh, R. Wong (2010) APPLICATION OF ADVANCED STATISTICAL METHODS TO FIND THE AVERAGE CLASS MARKS: PART II, INTED2010 Proceedings, pp. 2837-2844.
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