@InProceedings{ALBUSAC2018MOD,
author = {Albusac, J. and Castro-Schez, J.J. and Gonz{\'{a}}lez, C. and Vallejo, D.},
title = {MODEL FOR DETECTING ACADEMIC FAILURE AUTOMATICALLY AND EARLY ON},
series = {12th International Technology, Education and Development Conference},
booktitle = {INTED2018 Proceedings},
isbn = {978-84-697-9480-7},
issn = {2340-1079},
doi = {10.21125/inted.2018.2033},
url = {https://dx.doi.org/10.21125/inted.2018.2033},
publisher = {IATED},
location = {Valencia, Spain},
month = {5-7 March, 2018},
year = {2018},
pages = {8388-8397}}
TY - CONF
AU - J. Albusac
AU - J.J. Castro-Schez
AU - C. González
AU - D. Vallejo
TI - MODEL FOR DETECTING ACADEMIC FAILURE AUTOMATICALLY AND EARLY ON
SN - 978-84-697-9480-7/2340-1079
DO - 10.21125/inted.2018.2033
PY - 2018
Y1 - 5-7 March, 2018
CI - Valencia, Spain
JO - 12th International Technology, Education and Development Conference
JA - INTED2018 Proceedings
SP - 8388
EP - 8397
ER -
J. Albusac, J.J. Castro-Schez, C. González, D. Vallejo (2018) MODEL FOR DETECTING ACADEMIC FAILURE AUTOMATICALLY AND EARLY ON, INTED2018 Proceedings, pp. 8388-8397.