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Author: H. Michael-Onuoha
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TRENDS IN HI-TECH EXAMINATION MALPRACTICES: LESSONS FROM NIGERIA
G. Ifijeh, A. Asaolu, P. Ilo, I. Osinulu, O. Osayande, H. Michael-Onuoha, M. Iroaganachi, N. Nwokeoma, V. Itsekor, J. Ilogho - INTED2019 Proceedings - pages 9981-9988.